Programme Committee

Dieter Clement, Fraunhofer-FOM (GE)
Al Curran, ThermoAnalytics Inc. (USA)
Ingmar Renhorn, FOI (SE)
Rami Guissin, DVP Technologies Ltd. (IL)
James C. Jafolla, Surface Optics Corp. (USA)
Jean Latger, Oktal SE (FR)
Endre Repasi, Fraunhofer-IOSB (GE)
Antoine Roblin, ONERA (FR)
Bernard Rosier, ONERA (FR)
David Vaitekunas, W.R. Davis Engineering Ltd. (CND)